arXiv:2409.03769cs.CYcs.LG2024-09

用机器学习帮企业找环保替代零件,提升碳排放核算精度

Representation Learning of Complex Assemblies, An Effort to Improve Corporate Scope 3 Emissions Calculation

  • 基于物料清单和少量已知替代数据,构建组件知识图谱并学习嵌入表示
  • 通过设计偏置负样本,使模型在小样本下仍能准确识别可替代部件
  • 适用于制造业碳排放核算,尤其适合电子硬件企业做可持续设计

气候变化是政府、企业和公众共同面临的紧迫挑战,亟需准确评估制造产品和服务的气候影响。过程生命周期分析(pLCA)可用于评估从原材料开采到报废处理全生命周期的环境影响,并深入分析零部件、子组件、整机等层级的材料选择与制造工艺。然而,完整可靠的产品生命周期数据常难以获取,导致碳排放评估不准确。为克服这一数据局限,本文提出一种半监督学习框架,聚焦企业级电子硬件,利用产品物料清单(BOM)数据与少量组件级合格替代数据(正样本),构建机器知识图谱(MKG),学习电子硬件组件的有效嵌入表示。方法基于属性图嵌入,引入偏置负样本生成策略以显著提升训练效果。实验表明,该方法在性能与泛化能力上优于现有公开模型。

原文摘要 · Abstract (English)

Climate change is a pressing global concern for governments, corporations, and citizens alike. This concern underscores the necessity for these entities to accurately assess the climate impact of manufacturing goods and providing services. Tools like process life cycle analysis (pLCA) are used to evaluate the climate impact of production, use, and disposal, from raw material mining through end-of-life. pLCA further enables practitioners to look deeply into material choices or manufacturing processes for individual parts, sub-assemblies, assemblies, and the final product. Reliable and detailed data on the life cycle stages and processes of the product or service under study are not always available or accessible, resulting in inaccurate assessment of climate impact. To overcome the data limitation and enhance the effectiveness of pLCA to generate an improved environmental impact profile, we are adopting an innovative strategy to identify alternative parts, products, and components that share similarities in terms of their form, function, and performance to serve as qualified substitutes. Focusing on enterprise electronics hardware, we propose a semi-supervised learning-based framework to identify substitute parts that leverages product bill of material (BOM) data and a small amount of component-level qualified substitute data (positive samples) to generate machine knowledge graph (MKG) and learn effective embeddings of the components that constitute electronic hardware. Our methodology is grounded in attributed graph embeddings and introduces a strategy to generate biased negative samples to significantly enhance the training process. We demonstrate improved performance and generalization over existing published models.

碳排放计算半监督学习知识图谱电子硬件

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