提出新型图结构算法，有效检测高维复杂形状数据中的异常点。

This paper introduces a novel family of outlier detection algorithms based on Cluster Catch Digraphs (CCDs), specifically tailored to address the challenges of high dimensionality and varying cluster shapes, which deteriorate the performance of most traditional outlier detection methods. We propose the Uniformity-Based CCD with Mutual Catch Graph (U-MCCD), the Uniformity- and Neighbor-Based CCD with Mutual Catch Graph (UN-MCCD), and their shape-adaptive variants (SU-MCCD and SUN-MCCD), which are designed to detect outliers in data sets with arbitrary cluster shapes and high dimensions. We present the advantages and shortcomings of these algorithms and provide the motivation or need to define each particular algorithm. Through comprehensive Monte Carlo simulations, we assess their performance and demonstrate the robustness and effectiveness of our algorithms across various settings and contamination levels. We also illustrate the use of our algorithms on various real-life data sets. The U-MCCD algorithm efficiently identifies outliers while maintaining high true negative rates, and the SU-MCCD algorithm shows substantial improvement in handling non-uniform clusters. Additionally, the UN-MCCD and SUN-MCCD algorithms address the limitations of existing methods in high-dimensional spaces by utilizing Nearest Neighbor Distances (NND) for clustering and outlier detection. Our results indicate that these novel algorithms offer substantial advancements in the accuracy and adaptability of outlier detection, providing a valuable tool for various real-world applications. Keyword: Outlier detection, Graph-based clustering, Cluster catch digraphs, $k$-nearest-neighborhood, Mutual catch graphs, Nearest neighbor distance.