用双层优化自动学习缺陷合成的最佳位置,提升分割精度18.3%。
Synth4Seg -- Learning Defect Data Synthesis for Defect Segmentation using Bi-level Optimization
- 通过双层优化动态调整合成缺陷的位置和权重
- 在有限数据下使分割性能提升最高达18.3%
- 适合制造质检中数据稀缺场景的模型训练
缺陷分割对先进制造的质量控制至关重要,但数据稀缺制约了当前监督深度学习方法的表现。合成缺陷数据生成是缓解数据挑战的常用方法,但多数现有方法仅按固定规则生成缺陷,与下游任务性能关联弱,可能导致性能不佳甚至恶化。为此,本文提出一种基于双层优化的合成缺陷数据生成框架。采用基于Cut&Paste的在线生成模块,并使用高效的梯度优化算法求解双层优化问题,实现缺陷分割网络与数据合成模块参数的联合训练,以最大化分割网络在验证集上的性能。在基准数据集上有限数据设置下的实验表明,所提方法可学习最优缺陷粘贴位置,相比随机粘贴使分割性能提升最高达18.3%;同时,通过学习不同增强源缺陷数据的重要性权重,相比均等加权可带来最高2.6%的性能增益。
原文摘要 · Abstract (English)
Defect segmentation is crucial for quality control in advanced manufacturing, yet data scarcity poses challenges for state-of-the-art supervised deep learning. Synthetic defect data generation is a popular approach for mitigating data challenges. However, many current methods simply generate defects following a fixed set of rules, which may not directly relate to downstream task performance. This can lead to suboptimal performance and may even hinder the downstream task. To solve this problem, we leverage a novel bi-level optimization-based synthetic defect data generation framework. We use an online synthetic defect generation module grounded in the commonly-used Cut\&Paste framework, and adopt an efficient gradient-based optimization algorithm to solve the bi-level optimization problem. We achieve simultaneous training of the defect segmentation network, and learn various parameters of the data synthesis module by maximizing the validation performance of the trained defect segmentation network. Our experimental results on benchmark datasets under limited data settings show that the proposed bi-level optimization method can be used for learning the most effective locations for pasting synthetic defects thereby improving the segmentation performance by up to 18.3\% when compared to pasting defects at random locations. We also demonstrate up to 2.6\% performance gain by learning the importance weights for different augmentation-specific defect data sources when compared to giving equal importance to all the data sources.
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