用结构光照明显微，突破单次拍摄X射线成像分辨率瓶颈
Single-shot X-ray ptychography as a structured illumination method
- 将光栅束视为结构化照明，重构时考虑束间重叠与相干干涉
- 实现分辨率提升至传统方法极限的3.5倍
- 适用于未来单次曝光X射线显微镜设计优化
单次拍摄菊瓣成像是一种定量相位成像技术，通过网格排列的重叠光束同时照射样品，可在单次曝光中获取完整菊瓣数据集。该方法主要应用于光学波段，但受限于X射线光学约束，当前分辨率仍较低。本文将单次拍摄菊瓣成像重新诠释为一种结构化照明方法，将光束阵列视为单一高度结构化的照明函数。通过预标定该照明，并采用随机探针成像算法重建单次拍摄数据，可有效处理各束衍射间的重叠与相干干涉。实验结果表明，该方法实现的分辨率比传统算法基于数值孔径限制的极限高3.5倍。研究认为此重建策略适用于绝大多数单次拍摄菊瓣成像实验，并对下一代单次曝光X射线显微镜的设计具有重要启示。
原文摘要 · Abstract (English)
Single-shot ptychography is a quantitative phase imaging method wherein overlapping beams of light arranged in a grid pattern simultaneously illuminate a sample, allowing a full ptychographic dataset to be collected in a single shot. It is primarily used at optical wavelengths, but there is interest in using it for X-ray imaging. However, the constraints imposed by X-ray optics have limited the resolution achievable to date. In this work, we reinterpret single-shot ptychography as a structured illumination method by viewing the grid of beams as a single, highly structured illumination function. Pre-calibrating this illumination and reconstructing single-shot data using the randomized probe imaging algorithm allows us to account for the overlap and coherent interference between the diffraction arising from each beam. We achieve a resolution 3.5 times finer than the numerical aperture-based limit imposed by traditional algorithms for single-shot ptychography. We argue that this reconstruction method will work better for most single-shot ptychography experiments and discuss the implications for the design of future single-shot X-ray microscopes.
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