TSIM提升超分辨显微镜速度与清晰度，突破传统限制。
Experimental demonstration of Tessellation Structured Illumination Microscopy
- 采用拼接式结构光照明显微框架，革新图像重建方式
- 实现时间分辨率提升，扩展SIM空间分辨率超2倍
- 适合活细胞动态观测，减少重建伪影
结构光照明显微镜（SIM）通过将高频信息折叠至基带，可实现超分辨成像。尽管其兼容活细胞成像且光学系统简单，但依赖图像重建导致时间分辨率受限，并引入伪影。这一问题在扩展SIM中尤为严重，其空间分辨率已超过衍射极限两倍以上。本文提出并实验验证了拼接式结构光照明显微镜（TSIM）新框架，采用复兴的图像重建范式，有效缓解时间分辨率瓶颈与重建伪影，同时保持高空间分辨率性能。
原文摘要 · Abstract (English)
Structured Illumination Microscopy (SIM) overcomes the optical diffraction limit by folding high-frequency components into the baseband of the optical system, where they can be extracted and then repositioned to their original location in the Fourier domain. Although SIM is considered superior to other super-resolution (SR) methods in terms of compatibility with live cell imaging and optical setup simplicity, its reliance on image reconstruction restricts its temporal resolution and may introduce distortions in the super-resolved image. These inherent drawbacks are exacerbated in extended-SIM im-plementations, where spatial resolution surpasses the diffraction limit by more than 2-fold. Here, we present and demon-strate the Tessellation Structured Illumination Microscopy (TSIM) framework, which introduces a revived image recon-struction paradigm. With TSIM both the temporal resolution limit and the reconstruction artifacts that impact extended-SIM, are alleviated, without compromising the achievable spatial resolution.
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