用视觉变压器分析熔池热图像,少标注数据也能高精度检测3D打印缺陷。
In-Situ Melt Pool Characterization via Thermal Imaging for Defect Detection in Directed Energy Deposition Using Vision Transformers
- 基于自监督的视觉变压器模型提取熔池特征,无需大量标注数据。
- 在有限标注下实现95.44%~99.17%准确率,平均F1超80%。
- 适合工业界快速部署,降低3D打印质量控制成本。
定向能量沉积(DED)可制造复杂多材料构件,但内部孔隙和裂纹会损害性能。本研究聚焦熔池的原位监测与表征,以提升缺陷检测能力。传统机器学习依赖大量标注数据,而真实制造中难以获取。为此,我们采用基于视觉变压器的掩码自编码器(MAE)对未标注熔池数据进行自监督学习,生成高代表性嵌入;再通过迁移学习,在少量标注数据上训练分类器,实现异常熔池识别。评估两种分类器:(1) 使用微调后MAE编码器参数的视觉变压器(ViT)分类器;(2) 微调后的MAE编码器加MLP分类头。结果表明,整体准确率达95.44%至99.17%,平均F1分数超过80%,其中ViT分类器表现更优。该方法具备良好可扩展性与成本效益,适用于自动化质量控制。
原文摘要 · Abstract (English)
Directed Energy Deposition (DED) offers significant potential for manufacturing complex and multi-material parts. However, internal defects such as porosity and cracks can compromise mechanical properties and overall performance. This study focuses on in-situ monitoring and characterization of melt pools associated with porosity, aiming to improve defect detection and quality control in DED-printed parts. Traditional machine learning approaches for defect identification rely on extensive labeled datasets, often scarce and expensive to generate in real-world manufacturing. To address this, our framework employs self-supervised learning on unlabeled melt pool data using a Vision Transformer-based Masked Autoencoder (MAE) to produce highly representative embeddings. These fine-tuned embeddings are leveraged via transfer learning to train classifiers on a limited labeled dataset, enabling the effective identification of melt pool anomalies. We evaluate two classifiers: (1) a Vision Transformer (ViT) classifier utilizing the fine-tuned MAE Encoder's parameters and (2) the fine-tuned MAE Encoder combined with an MLP classifier head. Our framework achieves overall accuracy ranging from 95.44% to 99.17% and an average F1 score exceeding 80%, with the ViT Classifier slightly outperforming the MAE Encoder Classifier. This demonstrates the scalability and cost-effectiveness of our approach for automated quality control in DED, effectively detecting defects with minimal labeled data.
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