用普通扫描仪实现高精度材料反射与透射特性捕捉
Single-image Reflectance and Transmittance Estimation from Any Flatbed Scanner
- 基于内在图像分解思想，自动去除阴影和光泽干扰
- 首次实现单图扫描下材料透明度与透射率的精确估计
- 适配任意平板扫描仪，适合材质建模与数字孪生应用
平板扫描仪已成为高分辨率单图材质捕获的有力工具。然而，现有方法依赖特定条件（如均匀漫射光照），仅适用于高端设备，限制了其可扩展性与成本效益。本文受内在图像分解启发，提出一种新方法，能有效消除阴影与镜面反射，使任意平板扫描仪均可实现高质量材质捕获。进一步地，扩展了单图材质反射率捕获的范式，引入对不透明度与透射率的估计，作为完整材质外观（SVBSDF）的关键成分，显著提升各类材料在高分辨率下的重建精度。
原文摘要 · Abstract (English)
Flatbed scanners have emerged as promising devices for high-resolution, single-image material capture. However, existing approaches assume very specific conditions, such as uniform diffuse illumination, which are only available in certain high-end devices, hindering their scalability and cost. In contrast, in this work, we introduce a method inspired by intrinsic image decomposition, which accurately removes both shading and specularity, effectively allowing captures with any flatbed scanner. Further, we extend previous work on single-image material reflectance capture with the estimation of opacity and transmittance, critical components of full material appearance (SVBSDF), improving the results for any material captured with a flatbed scanner, at a very high resolution and accuracy
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