arXiv:2503.22143eess.SPcs.AI2025-03被引 2

用自监督学习训练通用模拟版图模型,少样本即可高效完成多种设计任务。

A Self-Supervised Learning of a Foundation Model for Analog Layout Design Automation

  • 基于UNet的自监督学习,通过随机采样和掩码增强小规模无标注版图数据。
  • 在6个已流片电路的32.4万张图上预训练,微调后96.6%生成版图无设计规则错误。
  • 微调仅需1/8数据即达全量训练效果,适合快速部署到各类模拟版图任务中。

我们提出一种基于UNet的通用模型及其自监督学习方法,以解决模拟版图设计中高质量标注数据稀缺与任务多样性过高的问题。通过随机片段采样与随机掩码技术,从少量未标注版图数据中自动构建大量增广数据,具备低偏差、等尺寸、信息丰富等特点。模型在324,000个样本(源自6个已流片的模拟电路)上预训练,学习通用版图模式知识,可微调适配多种下游任务:接触孔生成、通孔生成、虚拟指段生成、N阱生成及金属布线。微调后在超过一千个未见输入上成功生成满足DRC/LVS验证的版图,达标率达96.6%。相比从头训练金属布线模型,微调仅需1/8数据即可达到相同的0.95骰子分数;相同数据下,验证损失降低90%,基准得分提升40%。

原文摘要 · Abstract (English)

We propose a UNet-based foundation model and its self-supervised learning method to address two key challenges: 1) lack of qualified annotated analog layout data, and 2) excessive variety in analog layout design tasks. For self-supervised learning, we propose random patch sampling and random masking techniques automatically to obtain enough training data from a small unannotated layout dataset. The obtained data are greatly augmented, less biased, equally sized, and contain enough information for excessive varieties of qualified layout patterns. By pre-training with the obtained data, the proposed foundation model can learn implicit general knowledge on layout patterns so that it can be fine-tuned for various downstream layout tasks with small task-specific datasets. Fine-tuning provides an efficient and consolidated methodology for diverse downstream tasks, reducing the enormous human effort to develop a model per task separately. In experiments, the foundation model was pre-trained using 324,000 samples obtained from 6 silicon-proved manually designed analog circuits, then it was fine-tuned for the five example downstream tasks: generating contacts, vias, dummy fingers, N-wells, and metal routings. The fine-tuned models successfully performed these tasks for more than one thousand unseen layout inputs, generating DRC/LVS-clean layouts for 96.6% of samples. Compared with training the model from scratch for the metal routing task, fine-tuning required only 1/8 of the data to achieve the same dice score of 0.95. With the same data, fine-tuning achieved a 90% lower validation loss and a 40% higher benchmark score than training from scratch.

模拟版图自监督学习通用模型芯片设计

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