用稳定扩散生成光伏缺陷图像,提升真实感和多样性。
Photovoltaic Defect Image Generator with Boundary Alignment Smoothing Constraint for Domain Shift Mitigation
- 基于稳定扩散模型,引入语义嵌入与工业风格适配器增强生成质量。
- 生成图像FID得分比第二名低19.16点,下游检测性能显著提升。
- 适合光伏制造中数据稀缺场景的缺陷生成与模型训练。
准确检测光伏电池缺陷对智能光伏制造系统的质量和效率至关重要。然而,丰富缺陷数据的匮乏给模型训练带来巨大挑战。现有生成方法常因不稳定性、多样性不足和域偏移问题而受限。为此,本文提出PDIG,一种基于稳定扩散(Stable Diffusion, SD)的光伏缺陷图像生成器。PDIG利用大规模数据预训练的强先验,在数据有限情况下提升生成质量。具体地,引入语义概念嵌入(SCE)模块,结合文本条件先验捕捉缺陷类型与其外观的关系;设计轻量级工业风格适配器(LISA),通过交叉解耦注意力注入工业缺陷特征;推理时提出文本-图像双空间约束(TIDSC)模块,通过位置一致性与空间平滑对齐强化生成图像质量。大量实验表明,相比现有最优方法,PDIG在真实感和多样性上表现更优,FID降低19.16点,并显著提升下游缺陷检测性能。
原文摘要 · Abstract (English)
Accurate defect detection of photovoltaic (PV) cells is critical for ensuring quality and efficiency in intelligent PV manufacturing systems. However, the scarcity of rich defect data poses substantial challenges for effective model training. While existing methods have explored generative models to augment datasets, they often suffer from instability, limited diversity, and domain shifts. To address these issues, we propose PDIG, a Photovoltaic Defect Image Generator based on Stable Diffusion (SD). PDIG leverages the strong priors learned from large-scale datasets to enhance generation quality under limited data. Specifically, we introduce a Semantic Concept Embedding (SCE) module that incorporates text-conditioned priors to capture the relational concepts between defect types and their appearances. To further enrich the domain distribution, we design a Lightweight Industrial Style Adaptor (LISA), which injects industrial defect characteristics into the SD model through cross-disentangled attention. At inference, we propose a Text-Image Dual-Space Constraints (TIDSC) module, enforcing the quality of generated images via positional consistency and spatial smoothing alignment. Extensive experiments demonstrate that PDIG achieves superior realism and diversity compared to state-of-the-art methods. Specifically, our approach improves Frechet Inception Distance (FID) by 19.16 points over the second-best method and significantly enhances the performance of downstream defect detection tasks.
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