通过缓存参考特征,实现多服装组合虚拟试穿的快速推理。
FastFit: Accelerating Multi-Reference Virtual Try-On via Cacheable Diffusion Models
- 将参考特征编码与去噪过程解耦,仅计算一次即可复用。
- 在多个数据集上实现平均3.5倍速度提升,且保持高保真度。
- 适用于需要高效多参考试穿的电商、时尚应用开发场景。
尽管虚拟试穿技术潜力巨大,但其实际应用仍受两大挑战制约:现有方法无法支持多参考服饰组合(包括衣物与配饰),且因每步去噪需重复计算参考特征而效率低下。为此,我们提出FastFit,一种基于新型可缓存扩散架构的高速多参考虚拟试穿框架。通过引入半注意力机制,并以类别嵌入替代传统时间步嵌入,模型实现了参考特征编码与去噪过程的完全解耦,参数开销极小。参考特征仅需计算一次,即可无损复用于所有去噪步骤,从根本上突破效率瓶颈,在同类方法上平均提速3.5倍。此外,为推动复杂多参考虚拟试穿研究,我们构建了DressCode-MR数据集,包含28,179组高质量成对图像,覆盖上衣、下装、连衣裙、鞋履和包袋五大类,通过专家模型与人工反馈精修生成。在VITON-HD、DressCode及DressCode-MR上的实验表明,FastFit在关键保真度指标上优于现有最先进方法,同时显著提升推理效率。
原文摘要 · Abstract (English)
Despite its great potential, virtual try-on technology is hindered from real-world application by two major challenges: the inability of current methods to support multi-reference outfit compositions (including garments and accessories), and their significant inefficiency caused by the redundant re-computation of reference features in each denoising step. To address these challenges, we propose FastFit, a high-speed multi-reference virtual try-on framework based on a novel cacheable diffusion architecture. By employing a Semi-Attention mechanism and substituting traditional timestep embeddings with class embeddings for reference items, our model fully decouples reference feature encoding from the denoising process with negligible parameter overhead. This allows reference features to be computed only once and losslessly reused across all steps, fundamentally breaking the efficiency bottleneck and achieving an average 3.5x speedup over comparable methods. Furthermore, to facilitate research on complex, multi-reference virtual try-on, we introduce DressCode-MR, a new large-scale dataset. It comprises 28,179 sets of high-quality, paired images covering five key categories (tops, bottoms, dresses, shoes, and bags), constructed through a pipeline of expert models and human feedback refinement. Extensive experiments on the VITON-HD, DressCode, and our DressCode-MR datasets show that FastFit surpasses state-of-the-art methods on key fidelity metrics while offering its significant advantage in inference efficiency.
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