动态优化扫描路径，聚焦关键区域，提升显微成像效率与质量。

In x-ray microscopy, traditional raster-scanning techniques are used to acquire a microscopic image in a series of step-scans. Alternatively, scanning the x-ray probe along a continuous path, called a fly-scan, reduces scan time and increases scan efficiency. However, not all regions of an image are equally important. Currently used fly-scan methods do not adapt to the characteristics of the sample during the scan, often wasting time in uniform, uninteresting regions. One approach to avoid unnecessary scanning in uniform regions for raster step-scans is to use deep learning techniques to select a shorter optimal scan path instead of a traditional raster scan path, followed by reconstructing the entire image from the partially scanned data. However, this approach heavily depends on the quality of the initial sampling, requires a large dataset for training, and incurs high computational costs. We propose leveraging the fly-scan method along an optimal scanning path, focusing on regions of interest (ROIs) and using image completion techniques to reconstruct details in non-scanned areas. This approach further shortens the scanning process and potentially decreases x-ray exposure dose while maintaining high-quality and detailed information in critical regions. To achieve this, we introduce a multi-iteration fly-scan framework that adapts to the scanned image. Specifically, in each iteration, we define two key functions: (1) a score function to generate initial anchor points and identify potential ROIs, and (2) an objective function to optimize the anchor points for convergence to an optimal set. Using these anchor points, we compute the shortest scanning path between optimized anchor points, perform the fly-scan, and subsequently apply image completion based on the acquired information in preparation for the next scan iteration.