arXiv:2509.20946cs.CV2025-09

用无监督学习实现激光功率计涂层缺陷的实时检测,无需标注缺陷数据。

A Real-Time On-Device Defect Detection Framework for Laser Power-Meter Sensors via Unsupervised Learning

论文配图:A Real-Time On-Device Defect Detection Framework for Laser Power-Meter Sensors via Unsupervised Learning
图 1 · 摘自论文原文
  • 基于正常图像学习标准模式,自动识别未知缺陷类型。
  • 图像级与像素级AUROC分别达0.957和0.961,准确率超93%。
  • 可在设备端每张图0.5秒内完成检测,适合工业质检场景。

我们提出一种基于视觉的自动化系统,用于激光功率计传感器涂层缺陷的检测与分类。该方法解决涂层缺陷(如热损伤、划痕)导致激光能量测量不准的关键问题,尤其在医疗与工业应用中至关重要。系统采用无监督异常检测框架,仅使用“正常”传感器图像训练,学习正常涂层分布模式,从而无需大量标注缺陷数据即可检测已知及新型缺陷。方法包含三个核心组件:(1) 基于拉普拉斯边缘检测与K-means聚类的鲁棒预处理流程,用于定位感兴趣区域;(2) 利用StyleGAN2生成合成数据增强;(3) 基于UFlow的神经网络架构,实现多尺度特征提取与异常图生成。在366张真实传感器图像上的实验表明,对缺陷样本的准确率达93.8%,对正常样本准确率为89.3%,图像级AUROC为0.957,像素级AUROC为0.961。系统可实现自动化质量控制,每年潜在节省成本,且在设备端单图处理时间仅0.5秒。

原文摘要 · Abstract (English)

We present an automated vision-based system for defect detection and classification of laser power meter sensor coatings. Our approach addresses the critical challenge of identifying coating defects such as thermal damage and scratches that can compromise laser energy measurement accuracy in medical and industrial applications. The system employs an unsupervised anomaly detection framework that trains exclusively on ``good'' sensor images to learn normal coating distribution patterns, enabling detection of both known and novel defect types without requiring extensive labeled defect datasets. Our methodology consists of three key components: (1) a robust preprocessing pipeline using Laplacian edge detection and K-means clustering to segment the area of interest, (2) synthetic data augmentation via StyleGAN2, and (3) a UFlow-based neural network architecture for multi-scale feature extraction and anomaly map generation. Experimental evaluation on 366 real sensor images demonstrates $93.8\%$ accuracy on defective samples and $89.3\%$ accuracy on good samples, with image-level AUROC of 0.957 and pixel-level AUROC of 0.961. The system provides potential annual cost savings through automated quality control and processing times of 0.5 seconds per image in on-device implementation.

缺陷检测无监督学习实时检测工业质检

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