用深度学习提升无标记显微图像分辨率，不同网络适配不同信噪比。

The field of optical microscopy spans across numerous industries and research domains, ranging from education to healthcare, quality inspection and analysis. Nonetheless, a key limitation often cited by optical microscopists refers to the limit of its lateral resolution (typically defined as ~200nm), with potential circumventions involving either costly external modules (e.g. confocal scan heads, etc) and/or specialized techniques [e.g. super-resolution (SR) fluorescent microscopy]. Addressing these challenges in a normal (non-specialist) context thus remains an aspect outside the scope of most microscope users & facilities. This study thus seeks to evaluate an alternative & economical approach to achieving SR optical microscopy, involving non-fluorescent phase-modulated microscopical modalities such as Zernike phase contrast (PCM) and differential interference contrast (DIC) microscopy. Two in silico deep neural network (DNN) architectures which we developed previously (termed O-Net and Theta-Net) are assessed on their abilities to resolve a custom-fabricated test target containing nanoscale features calibrated via atomic force microscopy (AFM). The results of our study demonstrate that although both O-Net and Theta-Net seemingly performed well when super-resolving these images, they were complementary (rather than competing) approaches to be considered for image SR, particularly under different image signal-to-noise ratios (SNRs). High image SNRs favoured the application of O-Net models, while low SNRs inclined preferentially towards Theta-Net models. These findings demonstrate the importance of model architectures (in conjunction with the source image SNR) on model performance and the SR quality of the generated images where DNN models are utilized for non-fluorescent optical nanoscopy, even where the same training dataset & number of epochs are being used.