用神经网络精准模拟微流控芯片中细胞分离,提升设计效率与准确性。
Periodicity-Enforced Neural Network for Designing Deterministic Lateral Displacement Devices
- 在神经网络中加入周期性约束层,确保单元边界流动一致。
- 预测速度与压力场,关键直径误差仅0.478%,比基线提升85.4%。
- 适合需要高精度多单元微流控器件设计的研究者使用。
确定性侧向偏移(DLD)器件通过尺寸差异分离循环肿瘤细胞(CTCs),但其设计依赖昂贵的纳维-斯托克斯仿真和粒子追踪分析。现有深度学习代理模型常忽略关键的周期性边界条件,导致多单元预测累积误差。本文提出一种周期性强制代理建模方法,将周期性层嵌入神经网络架构,无需惩罚项或输出修正即可保证精确周期性。该方法采用三个子网络预测稳态无量纲速度场(u, v)与压力场(p),实现完整流场表征与更高设计灵活性。周期性层通过结构强制实现单元边界流动匹配。在120个CFD生成几何上的验证表明,该方法关键直径误差为0.478%,周期性一致性完美,相较基线提升85.4%。该方法可高效准确地设计多单元DLD器件,确保边界条件严格满足。
原文摘要 · Abstract (English)
Deterministic Lateral Displacement (DLD) devices enable liquid biopsy for cancer detection by separating circulating tumor cells (CTCs) from blood samples based on size, but designing these microfluidic devices requires computationally expensive Navier-Stokes simulations and particle-tracing analyses. While recent surrogate modeling approaches using deep learning have accelerated this process, they often inadequately handle the critical periodic boundary conditions of DLD unit cells, leading to cumulative errors in multi-unit device predictions. This paper introduces a periodicity-enforced surrogate modeling approach that incorporates periodic layers, neural network components that guarantee exact periodicity without penalty terms or output modifications, into deep learning architectures for DLD device design. The proposed method employs three sub-networks to predict steady-state, non-dimensional velocity and pressure fields (u, v, p) rather than directly predicting critical diameters or particle trajectories, enabling complete flow field characterization and enhanced design flexibility. Periodic layers ensure exact matching of flow variables across unit cell boundaries through architectural enforcement rather than soft penalty-based approaches. Validation on 120 CFD-generated geometries demonstrates that the periodic layer implementation achieves 0.478% critical diameter error while maintaining perfect periodicity consistency, representing an 85.4% improvement over baseline methods. The approach enables efficient and accurate DLD device design with guaranteed boundary condition satisfaction for multi-unit device applications.
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