提出新指标预测量子分类器在噪声下的表现，解决仿真与真实设备结果不符问题。

Variational Quantum Algorithms (VQAs) have been extensively researched for applications in Quantum Machine Learning (QML), Optimization, and Molecular simulations. Although designed for Noisy Intermediate-Scale Quantum (NISQ) devices, VQAs are predominantly evaluated classically due to uncertain results on noisy devices and limited resource availability. Raising concern over the reproducibility of simulated VQAs on noisy hardware. While prior studies indicate that VQAs may exhibit noise resilience in specific parameterized shallow quantum circuits, there are no definitive measures to establish what defines a shallow circuit or the optimal circuit depth for VQAs on a noisy platform. These challenges extend naturally to Variational Quantum Classification (VQC) algorithms, a subclass of VQAs for supervised learning. In this article, we propose a relative entropy-based metric to verify whether a VQC model would perform similarly on a noisy device as it does on simulations. We establish a strong correlation between the average relative entropy difference in classes, transpilation circuit depth, and their performance difference on a noisy quantum device. Our results further indicate that circuit depth alone is insufficient to characterize shallow circuits. We present empirical evidence to support these assertions across a diverse array of techniques for implementing VQC, datasets, and multiple noisy quantum devices.