arXiv:2604.11162cs.CV2026-04中稿 · CVPR

用噪声标签训练缺陷分割模型,提升工业质检精度。

Boxes2Pixels: Learning Defect Segmentation from Noisy SAM Masks

论文配图:Boxes2Pixels: Learning Defect Segmentation from Noisy SAM Masks
图 1 · 摘自论文原文
  • 将边界框转为伪掩码,用教师模型指导学生网络学习
  • 在风机数据集上,缺陷分割mIoU提升6.97,二值IoU提升9.71
  • 轻量设计仅需80%参数,适合资源受限的工业场景

精准的缺陷分割对工业检测至关重要,但密集像素标注罕见。常见方法是用基础分割模型(如SAM)将廉价的边界框转换为伪掩码。然而,这些伪标签在工业表面存在系统性噪声,常误检背景结构并漏检稀疏缺陷。为此提出噪声鲁棒的盒到像素蒸馏框架Boxes2Pixels,将SAM视为噪声教师而非真值监督源。边界框通过SAM离线生成伪掩码,学生模型基于冻结的DINOv2特征,采用分层解码器保持语义稳定,增设辅助二值定位头以分离前景发现与类别预测,并引入单向在线自校正机制,在学生自信时放松背景监督,聚焦修正教师的假阴性。在人工标注的风机巡检基准上,所提方法在相同弱监督条件下,异常mIoU提升6.97,二值IoU提升9.71;在线自校正使二值召回率提高18.56,模型可训练参数减少80%。代码已公开于https://github.com/CLendering/Boxes2Pixels。

原文摘要 · Abstract (English)

Accurate defect segmentation is critical for industrial inspection, yet dense pixel-level annotations are rarely available. A common workaround is to convert inexpensive bounding boxes into pseudo-masks using foundation segmentation models such as the Segment Anything Model (SAM). However, these pseudo-labels are systematically noisy on industrial surfaces, often hallucinating background structure while missing sparse defects. To address this limitation, a noise-robust box-to-pixel distillation framework, Boxes2Pixels, is proposed that treats SAM as a noisy teacher rather than a source of ground-truth supervision. Bounding boxes are converted into pseudo-masks offline by SAM, and a compact student is trained with (i) a hierarchical decoder over frozen DINOv2 features for semantic stability, (ii) an auxiliary binary localization head to decouple sparse foreground discovery from class prediction, and (iii) a one-sided online self-correction mechanism that relaxes background supervision when the student is confident, targeting teacher false negatives. On a manually annotated wind turbine inspection benchmark, the proposed Boxes2Pixels improves anomaly mIoU by +6.97 and binary IoU by +9.71 over the strongest baseline trained under identical weak supervision. Moreover, online self-correction increases the binary recall by +18.56, while the model employs 80\% fewer trainable parameters. Code is available at https://github.com/CLendering/Boxes2Pixels.

缺陷分割弱监督工业质检自校正

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