统一检测工业缺陷,抗干扰更强且无需多个模型
Feature Perturbation Pool-based Fusion Network for Unified Multi-Class Industrial Defect Detection
- 用随机噪声注入增强特征鲁棒性,应对未知缺陷形态
- 多层融合保留细节,像素级检测准确率达99.08%
- 基于UniAD框架,零额外参数实现顶尖性能
多类别工业缺陷检测在质量检验中至关重要但面临两大挑战:(i) 需为每类缺陷单独训练模型,导致计算与内存开销大;(ii) 跨类别建模时因特征扰动导致鲁棒性下降。本文提出FPFNet,通过随机特征扰动池与多层特征融合策略,在统一框架下协同解决上述问题。扰动池在特征表示中注入高斯噪声、F-Noise和F-Drop等多样噪声模式,提升模型对领域偏移和未见缺陷形态的鲁棒性。同时,多层融合模块通过残差连接与归一化,聚合编码器与解码器的层次化特征,捕捉复杂跨尺度关系并保留精细空间细节。基于UniAD架构,该方法在两个主流基准上达到领先性能:在MVTec-AD上图像级AUROC达97.17%、像素级达96.93%;在VisA上图像级达91.08%、像素级达99.08%,显著超越现有方法,且不引入额外可学习参数或计算开销。
原文摘要 · Abstract (English)
Multi-class defect detection constitutes a critical yet challenging task in industrial quality inspection, where existing approaches typically suffer from two fundamental limitations: (i) the necessity of training separate models for each defect category, resulting in substantial computational and memory overhead, and (ii) degraded robustness caused by inter-class feature perturbation when heterogeneous defect categories are jointly modeled. In this paper, we present FPFNet, a Feature Perturbation Pool-based Fusion Network that synergistically integrates a stochastic feature perturbation pool with a multi-layer feature fusion strategy to address these challenges within a unified detection framework. The feature perturbation pool enriches the training distribution by randomly injecting diverse noise patterns -- including Gaussian noise, F-Noise, and F-Drop -- into the extracted feature representations, thereby strengthening the model's robustness against domain shifts and unseen defect morphologies. Concurrently, the multi-layer feature fusion module aggregates hierarchical feature representations from both the encoder and decoder through residual connections and normalization, enabling the network to capture complex cross-scale relationships while preserving fine-grained spatial details essential for precise defect localization. Built upon the UniAD architecture~\cite{you2022unified}, our method achieves state-of-the-art performance on two widely adopted benchmarks: 97.17\% image-level AUROC and 96.93\% pixel-level AUROC on MVTec-AD, and 91.08\% image-level AUROC and 99.08\% pixel-level AUROC on VisA, surpassing existing methods by notable margins while introducing no additional learnable parameters or computational complexity.
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