arXiv:2604.22857cs.CV2026-04

用物联网+CNN实时检测3D打印缺陷,准确率达99.5%

IoT-Enhanced CNN-Based Labelled Crack Detection for Additive Manufacturing Image Annotation in Industry 4.0

  • 结合物联网与边缘计算,实现打印表面缺陷的实时检测
  • 在14,982张图像上达99.54%准确率,缺陷检测F1-score达97%
  • 适合工业4.0场景下的智能质检,尤其关注高精度制造

本文提出一种基于物联网增强的深度学习框架,利用卷积神经网络(CNN)实现增材制造(AM)表面裂纹的自动检测。通过集成物联网实时监测、高分辨率成像与边缘计算,系统支持持续在位缺陷检测与分类。实时数据采集使CNN分析即时执行,显著提升质量控制的准确性和效率。框架支持监督与半监督学习,在大规模稀疏标注数据集上表现稳健。采用LabelImg标注与OpenCV预处理,模型在14,982张图像上达到99.54%准确率,96%精确率,98%召回率,F1-score为97%。数据集平衡与增强将准确率从32%提升至99%。系统还建立工艺参数、缺陷形成与表面拓扑间的关联,支持预测分析与缺陷缓解。符合工业4.0理念,集成数字孪生(DT)技术,实现过程仿真、预测性维护与自适应控制。核心贡献包括基于树莓派4B的物联网监控系统、经量化与批量处理优化的CNN(推理延迟降低47%),以及基于MQTT的5G低延迟数据流系统(传输开销降低35%)。DT集成进一步实现缺陷预测与工艺参数动态调整。该工作为智能增材制造质量控制提供了可扩展、高精度、低延迟的解决方案。未来方向包括多模态数据融合、混合架构与增强型数字孪生模拟。

原文摘要 · Abstract (English)

This paper presents an IoT-enhanced deep learning framework for automated crack detection in Additive Manufacturing (AM) surfaces using convolutional neural networks (CNNs). By integrating IoT-enabled real-time monitoring, high-resolution imaging, and edge computing, the system enables continuous in-situ defect detection and classification. Real-time data acquisition supports immediate CNN-based analysis, improving both accuracy and efficiency in AM quality control. The framework supports supervised and semi-supervised learning, enabling robust performance on large, sparsely annotated datasets. Using LabelImg for annotation and OpenCV for preprocessing, the system achieves 99.54% accuracy on 14,982 images, with 96% precision, 98% recall, and a 97% F1-score. Dataset balancing and augmentation significantly improve generalization, increasing accuracy from 32% to 99%. Beyond detection, the framework establishes a linkage between AM process parameters, defect formation, and surface topology, supporting predictive analytics and defect mitigation. Aligned with Industry 4.0, it incorporates Digital Twin (DT) technology for real-time process simulation, predictive maintenance, and adaptive control. Key contributions include an IoT-based monitoring system using edge devices (Raspberry Pi 4B), an optimized CNN with model quantization and batch processing reducing inference latency by 47%, and an MQTT-based low-latency data streaming system with 5G connectivity, lowering transmission overhead by 35%. DT integration further enables predictive defect analysis and dynamic adjustment of AM parameters. This work advances intelligent AM quality control by providing a scalable, high-accuracy, and low-latency framework. Future directions include multimodal data fusion, hybrid architectures, and enhanced Digital Twin simulations for AI-driven defect prevention.

缺陷检测工业4.0边缘计算数字孪生

Thank you to arXiv for use of its open access interoperability. PaperDance 不是 arXiv 官方产品;中文卡片由大模型生成,请以原文为准。