用量子增强的视觉模型，高效识别芯片晶圆缺陷。

Extracting actionable knowledge from industrial visual data is fundamentally bottlenecked by extreme class imbalance and the prohibitive computational complexity of modern foundation models. In semi-conductor manufacturing, identifying multi-label wafer defects is a complex spatial data mining task where overlapping patterns obscure critical root-cause signals. While Vision Transformers (ViTs) excel at global dependency extraction, their quadratic scaling renders them inefficient for high-throughput, real-time anomaly detection. To overcome these computational barriers, this paper introduces Hybrid Quantum-MambaVision, a highly efficient architecture tailored for spatial knowledge discovery. We integrate a linear-complexity State-Space Model (SSM) backbone with a Parameterized Quantum Context Adapter (QCA) and Low-Rank Adaptation (LoRA). The Mamba backbone efficiently captures long-range spatial dependencies, while the quantum adapter maps compressed latent features into a high-dimensional Hilbert space to disentangle complex, overlapping signatures. On the highly imbalanced MixedWM38 dataset, Hybrid Quantum-MambaVision achieves exceptional multi-label classification performance, significantly reducing the error rate on complex multi-defect topologies compared to classical baselines. The quantum regularizer acts as a profound uncertainty calibrator, substantially reducing Maximum Calibration Error (MCE) and minimizing expected false-positive costs. This work establishes a scalable Quantum-Classical hybrid paradigm for efficient representation learning in industrial data mining.