用Transformer统一设计多层薄膜材料与厚度,效率超传统方法。
PRISM: Position-encoded Regressive Inverse Spectral Model for Multilayer Thin-Film Design

- 用自回归Transformer联合预测材料种类和厚度。
- 参数量仅1/5却将误差降低50%以上,44M模型误差达0.010。
- 适合需要快速高效优化光学薄膜的工程师与科研人员。
多层薄膜光学涂层的设计属于复杂的组合-连续优化问题。本文提出PRISM(位置编码回归逆光谱模型),一种统一的解码器-only 自回归变换器,通过单一主干网络同时预测离散材料选择与连续厚度。PRISM引入两项核心创新:(1) 光谱前缀条件化,利用标准前缀标记实现上下文目标注入;(2) 累积深度旋转位置编码,将连续厚度直接嵌入位置表示中,以保持堆叠结构的物理空间关系。基准测试显示,一个1300万参数的PRISM模型相比其他变换器基线,平均绝对误差(MAE)降低超过50%,且仅需五分之一参数量。此外,4400万参数变体在本分布验证基准上达到最先进的性能(MAE=0.010),运行速度显著快于模拟退火,为经典优化方法提供了高效替代方案。
原文摘要 · Abstract (English)
The inverse problem of multilayer thin-film optical coatings design represents a complex combinatorial-continuous optimization challenge. We present PRISM (Position-encoded Regressive Inverse Spectral Model), a unified decoder-only autoregressive transformer that streamlines this process by jointly predicting discrete material selection and continuous thickness regression within a single backbone. PRISM introduces two primary architectural innovations: (1) spectrum prefix conditioning, which utilizes standard prefix tokens for in-context target injection, and (2) cumulative-depth Rotary Position Embeddings, which encode continuous thickness directly into the positional representation to preserve the physical spatial relationships of the stack. Our benchmarks demonstrate that a PRISM-13M model reduces MAE by over 50\% compared to other transformer baselines while utilizing only one-fifth of the parameters. Furthermore, a 44M-parameter variant achieves state-of-the-art performance (MAE = 0.010) on our in-distribution validation benchmark and operates significantly faster than simulated annealing, offering a highly efficient alternative to classical optimization methods.
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