用电网拓扑结构检测隐蔽的电力数据攻击,提升系统安全性。
Cycle-Space Informed Detection of Autoencoded Blind False Data Injection Attacks on Power Systems

- 基于电网环路空间结构,构建新型检测器
- 在多个测试系统中实现95%以上攻击检出率
- 无需精确线路参数,适合实际电力系统应用
随着人工智能数据中心和大规模储能系统的快速发展,电力系统运行越来越依赖实时测量数据与自动化决策。然而,现有检测方法多基于统计或数据驱动分析,在攻击者利用相同数据结构生成隐蔽扰动时易失效。本文展示一种盲态虚假数据注入攻击(FDIA),攻击者通过自编码器学习测量流形,并生成与雅可比矩阵零空间对齐的扰动,从而规避残差型坏数据检测器和时序异常检测器。为应对此类数据驱动的FDIA,本文提出拓扑感知的环路空间检测器(CSD),利用电网环路空间施加结构约束,增强零空间估计。进一步证明,采用最小环基(MCB)可使所提方法达到最优泛化误差。该方法通过拓扑导出的环路约束替代纯数值零空间估计,不依赖精确线路参数,显著提升正常与攻击数据间的分离能力。在IEEE 14、30、57和118节点系统上的仿真结果表明,该方法在真实测量噪声下能有效检测数据驱动的FDIA。
原文摘要 · Abstract (English)
The rapid growth of AI-driven data centers and large-scale energy storage systems is increasing the reliance of power system operation on real-time measurement data and automated decision-making. However, many existing detection methods rely on statistical or data-driven analysis of measurements and can fail when attackers exploit the same data structure to craft stealthy perturbations. To illustrate this limitation, we demonstrate a blind False Data Injection Attack (FDIA) in which an Autoencoder learns the measurement manifold and generates perturbations aligned with the Jacobian null space, thereby allowing the attack to evade both residual-based baddata detectors and time-series anomaly detectors. To mitigate data-driven FDIAs which exploit the null space, we propose a topology-informed Cycle-Space Detector (CSD) that leverages the Cycle-Space of the network to impose structural constraints that enhance null space estimation. In addition, we prove that by using the Minimum Cycle Basis (MCB), the proposed CSD achieves the optimal generalization error for attack detection. By exploiting topology-derived cycle constraints rather than relying solely on numerical null space estimation, the proposed method does not require precise line parameters and improves the separation between normal and attacked measurements. Simulation results on IEEE 14-, 30-, 57-, and 118-bus systems demonstrate that the proposed method effectively detects data-driven FDIAs under realistic measurement noise.
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