用普通摄像头做高精度X光扫描,看清软组织细节。
Absorption and Phase-Contrast Microtomography Using Direct X-ray Detection With COTS CMOS Sensors
- 直接用消费级CMOS传感器捕捉X光,省去光学镜头
- 实现3.9至5.2微米分辨率,可看清软组织边界
- 成本低、操作简单,适合实验室日常使用
本研究提出一种基于商用现成(COTS)CMOS图像传感器的高分辨率X射线微断层成像系统,利用传感器自身分辨率实现无光学组件的断层重建。系统采用微焦点X射线源与锥形束几何结构,支持吸收对比和基于传播的相位对比成像。通过动态平坦场校正算法缓解长时间曝光中的辐射损伤问题,克服了消费级硬件的局限性。系统可实现3.9至5.2微米的体素分辨率,相位对比显著增强软组织边界的可视化效果。相比同步辐射或纳米焦点系统,该方案更简单、成本更低,且避免复杂光学系统与慢速扫描。结果表明,COTS CMOS传感器在实验室尺度高分辨率微断层成像中具有可行性。
原文摘要 · Abstract (English)
This work presents a high-resolution X-ray microtomography system that uses commercial off-the-shelf (COTS) CMOS image sensors as direct detectors, relying on the sensor s intrinsic resolution to achieve tomographic reconstructions without optical components. The system employs a microfocus X-ray source in cone-beam geometry, enabling both absorption-contrast and propagation-based phase-contrast imaging. A dynamic flat-field correction algorithm mitigates radiation-induced degradation during long acquisitions, helping to overcome limitations of consumer-grade hardware. The setup provides voxel sizes from 3.9 micron to 5.2 micron. Phase contrast visualizes soft tissue boundaries that would be undetectable by conventional radiography. Compared to synchrotron or nanofocus systems, our solution is simpler, lower-cost, and avoids complex optics or slow scans. COTS CMOS sensors appear as a viable alternative for laboratory-scale high-resolution microtomography.
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