用结构化方法生成确定性测试平台,提升硬件设计验证效率与准确性。
Structured Testbench Generation for LLM-Driven HDL Design and Verification-Oriented Data Curation

- 基于硬件结构设计生成确定性测试平台,避免随机输出问题。
- 比传统LLM流程快720倍,编译成功率更高,错误通过率降低。
- 适合芯片设计自动化、LLM辅助硬件验证的研究者与工程师使用。
在大型语言模型(LLM)驱动的寄存器传输级(RTL)工作流中,自动化测试平台生成已成为关键瓶颈,需快速可靠地验证大量候选设计。现有基于提示的方法将测试平台生成视为无约束代码合成,导致输出随机、词元开销高、可复现性差且覆盖率不足。为此,我们提出结构化测试平台生成框架STG,利用硬件设计的内在结构生成确定性测试平台。作为验证工具,STG运行速度比迭代式LLM测试生成流程快720倍,编译成功率达更高,覆盖率更高,且对错误设计的误通过率更低。作为数据整理引擎,其在单核CPU上比LLM过滤快11倍,能耗降低127倍,提炼出的模型在多基准评估中达到领先性能。作为测试时缩放的决策依据,可减少14%-47%的节点数。相关模型已在Hugging Face公开:https://huggingface.co/collections/AS-SiliconMind/siliconmind-v12。
原文摘要 · Abstract (English)
Automated testbench generation has become a critical bottleneck in large language model (LLM)-driven Register Transfer Level (RTL) workflows, where large numbers of candidate designs must be verified rapidly and reliably. Existing prompt-based approaches treat testbench generation as unconstrained code synthesis, yielding stochastic outputs with high token cost, low reproducibility, and insufficient coverage. To address this gap, we present STG, a Structured Testbench Generation framework that exploits the inherent structure of hardware designs to generate deterministic testbenches. As a direct verification tool, STG runs 720x faster than an iterative LLM-based testbench generation flow and higher rate of successful compilation, achieves higher coverage, and reduces false-pass verdicts on incorrect DUTs. STG also helps identify errors in RTL generation benchmarks by exposing faulty benchmark testbenches. As a data curation engine, it is 11x faster than LLM-based filtering on a single CPU core with 127x less energy, and the resulting distilled models provide state-of-the-art performance in our multi-benchmark evaluation. As a test-time scaling oracle, it reduces node count by 14-47\%. Our models are available at https://huggingface.co/collections/AS-SiliconMind/siliconmind-v12.
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