用形状特征改进缺陷检测的样本分配,提升定位精度。
Morphology-Aware Sample Assignment: Overcoming IoU Insensitivity for Surface Defect Detection
- 引入面积、形状、长宽比等形态相似性指标优化正样本选择
- 在NEUDET和GC10-DET上实现稳定性能提升,无推理开销
- 适合工业视觉检测场景,可直接接入YOLOv9框架
交并比(IoU)作为评估候选框与真实标注空间对齐的核心指标,直接影响正样本集质量与检测模型训练效果。通过理论建模分析,我们发现IoU响应曲线上存在一个非敏感区域,在该区域内不同几何重叠度的样本产生几乎相同的IoU分数。为克服此局限,我们提出一组涵盖面积、形状和长宽比的形态相似性度量,用于精炼正样本分配过程,从而实现更具区分性的匹配。通过这些多维相似性的均值聚合生成补充匹配得分,弥补了IoU在表达结构对应关系上的不足。理论上,引入形态相似性重塑了匹配函数的响应分布,产生有效方向梯度和类多边形等响应轮廓,使高响应区域紧密聚焦于每个真实目标,显著提升正样本选择精度。基于YOLOv9框架的实验表明,该方法在NEUDET和GC10-DET数据集上均取得一致性能提升。值得注意的是,该方法完全即插即用,不增加任何推理开销,保障了工业视觉检测中的部署效率。
原文摘要 · Abstract (English)
Intersection-over-Union (IoU), as a pivotal metric for evaluating the spatial alignment between candidate proposals and ground-truth annotations, directly determines the quality of positive sample sets and the training efficacy of visual detection models. Through theoretical modeling and analysis, we uncover a non-sensitive region on the IoU response curve, within which samples yield nearly identical IoU scores despite distinct geometric overlaps. To overcome this limitation, we introduce a set of morphological similarity metrics covering area, shape, and aspect ratio, to refine the positive sample assignment process, thereby ensuring more discriminative and reliable matching. A supplementary matching score is derived via mean-based aggregation of these multidimensional similarities, compensating for the intrinsic limitation of IoU in representing structural correspondence. Theoretically, incorporating morphological similarity reshapes the response distribution of the matching function, yielding both effective directional gradients and polygon-like iso-response contours, which tightly confine high-response regions around each ground-truth instance and substantially enhance the precision of positive sample selection. Experiments based on the YOLOv9 framework demonstrate consistent performance gains on both NEUDET and GC10- DET datasets. Notably, the proposed approach is fully plug-and-play and incurs zero additional inference overhead, thereby ensuring deployment efficiency for industrial visual inspection.
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