揭示子模信息度量如何影响表示学习中的类内方差与类间分离，为选择目标函数提供理论依据。

Submodular Information Measures (SIMs) have recently emerged as a powerful framework for representation learning and multimodal learning. In particular, the SCORE framework~\cite{majee2024score} demonstrated that SIMs can serve as effective objectives for supervised contrastive learning. Despite their empirical success, however, the geometric and statistical properties induced by different submodular information measures remain poorly understood. In this work, we develop a unified theoretical framework connecting SIMs to classical concepts in representation learning and statistical pattern recognition. We show that Total Information (TI) objectives characterize intra-class structure: Graph Cut TI recovers within-class variance, LogDet TI recovers generalized variance and covariance volume, and Facility Location TI induces imbalance-aware separation that emphasizes rare and confusable classes. We further show that Mutual Information (MI) objectives capture complementary notions of inter-class structure: Graph Cut MI is closely related to centroid separation and Fisher-style discrimination, LogDet MI captures covariance-aware separation through Mahalanobis distance, and Facility Location MI measures nearest-mode representational overlap. We validate these theoretical characterizations using controlled synthetic experiments that independently vary variance, covariance, class imbalance, class separation, and multimodal overlap. Across all settings, the empirical behavior closely matches the proposed theory. Our results provide the first unified geometric and statistical understanding of submodular information measures and offer principled guidance for selecting and designing SIM-based objectives for representation learning.