无需真实异常样本,就能生成精准工业缺陷图像。
DeCo: Zero-Shot Industrial Anomaly Generation through Decoupling and Recoupling

- 将缺陷结构与源产品解耦,再注入目标产品纹理
- 在MVTec AD上提升5.1%像素级检测精度
- 适合缺乏异常数据的工业质检场景
工业异常检测因真实异常数据稀缺而受限。零样本异常生成可在无目标产品真实异常图像的情况下生成缺陷。现有方法存在两大问题:缺陷信息获取不准、缺陷与产品融合失控。为此,我们提出DeCo,先将缺陷结构从源产品中解耦,再显式地与目标产品的正常纹理重新耦合。在缺陷信息获取阶段,双路由流(DR-Flow)将与纹理无关的缺陷结构绑定至异常标记,同时产品不变流(PI-Flow)阻止该标记绑定源产品。在缺陷-产品融合阶段,采用混合注入策略重构缺陷结构与目标产品的关系,并通过产品兼容性修正(PCC)弥补结构与产品间的不匹配。大量实验表明,DeCo达到新基准:在生成数据上训练下游检测模型,在MVTec AD上像素级平均精度提升5.1%,在VisA上提升8.2%。代码已开源:https://github.com/HUST-SLOW/DeCo。
原文摘要 · Abstract (English)
Industrial anomaly inspection is severely hindered by the scarcity of real anomalous data. Zero-shot industrial anomaly generation addresses this by generating anomalies on specific products without requiring any of their real anomalous images. However, existing methods suffer from two critical limitations, i.e., inaccurate anomaly information acquisition and uncontrolled anomaly-product fusion. To overcome these challenges, we propose DeCo, which decouples the anomaly structure from its source product, and explicitly recouples it with the normal textures of the target product. During anomaly information acquisition, Dual-Routing Flow (DR-Flow) binds the texture-invariant anomaly structure to an abnormal token, while a parallel constraint, Product-Invariant Flow (PI-Flow), prevents the abnormal token from binding the source product. During anomaly-product fusion, we propose a hybrid injection to recouple the acquired anomaly structure with the target product, and Product Compatibility Correction (PCC) to compensate for the incompatibility between the acquired anomaly structure and the product. Extensive experiments demonstrate that DeCo establishes a new state-of-the-art. Training downstream detection models on our generated data yields massive pixel AP improvements of 5.1% on MVTec AD and 8.2% on VisA. Code is available at https://github.com/HUST-SLOW/DeCo.
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