利用扫描几何关系统一定位多张X射线荧光图像，提升配准精度。
Acquisition Geometry-Assisted Whole-Group Localization of X-ray Fluorescence Maps in Optical Microscopy Images
- 基于采集几何关系，对整组XRF图像进行统一配准
- 组级配准在实验中实现0.931的交并比，显著优于独立配准
- 适用于多尺度、高分辨率的显微成像数据融合
X射线荧光（XRF）显微成像可绘制元素分布，而光学显微镜则提供互补的形态学信息。将XRF视场（FOV）定位到光学图像中十分困难，因两者对比机制和分辨率差异大。当前多数流程独立放置每张XRF图，尽管采集元数据已记录各图之间的相对扫描位置。本研究提出XRF图组整体定位方法，以采集几何为约束，使用组交并比（GroupIoU）量化配准效果。在受控案例中，独立定位的GroupIoU为0.000，而组定位达到0.931。将归一化互相关（NCC）替换为互信息（MI）后结果相近，表明结果不依赖特定相似性度量。在多尺度案例中，用粗分辨率XRF普查扫描连接细粒度图组，平均GroupIoU从0.694提升至0.856。这些结果支持在定位相关XRF图时，明确引入采集几何作为约束条件。
原文摘要 · Abstract (English)
X-ray fluorescence (XRF) microscopy maps elemental distributions, while optical microscopy can provide complementary morphological context. Localizing XRF fields of view (FOVs) in optical images is difficult because the two modalities differ in contrast mechanism and resolution. Most current workflows place each XRF tile independently, even when acquisition metadata already record the tiles' relative scan positions. This study formalizes XRF tile-group localization, in which one optical-frame placement is estimated for the whole group, constrained by acquisition geometry and quantified using group intersection-over-union (GroupIoU). In a controlled case study, independent localization failed with GroupIoU 0.000, whereas group localization achieved 0.931. Replacing the normalized cross-correlation (NCC) metric with mutual information (MI) gave nearly identical results, showing that the outcome is not specific to one local similarity metric. In another multiscale case study, using a coarse XRF survey scan to connect the fine-scale tile group to the optical image increased mean GroupIoU from 0.694 to 0.856. These case studies support using acquisition geometry as an explicit constraint when localizing related XRF tiles.
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