用过滤污染数据的方法提升工业缺陷检测精度,让不靠谱的参考图也能变有用。
When More References Hurt: Contamination-Aware DINOv2 Memory Banks for Few-Shot Steel Defect Detection

- 从干净种子库出发,剔除最可疑20%的异常补丁,保留优质样本。
- 在51,200补丁预算下,AUPRC提升至0.1084,比原始方法高0.0134。
- 仅0.5%污染即导致性能暴跌,证明参考数据纯净度至关重要。
补丁记忆异常检测器假设其参考库全为正常样本,但工业图像未经验证时该假设难以成立。本文研究在仅有少量可信正常图像的前提下,能否从含污染的参考图像中安全恢复有效正常补丁,且无需缺陷标注。基于AnomalyDINO使用的DINOv2补丁记忆框架,通过距离清洁种子库的相似性评分候选补丁,剔除最可疑的20%,将剩余补丁与种子合并,并采用贪心核心集选择维持固定预算。在Severstal数据集上,新增参考图像中包含9.46%异常补丁;所提方法剔除78.1%的异常补丁,残余污染降至2.59%。在相同51,200补丁预算下,新方法达到0.1084 AUPRC,优于朴素扩展(0.0950)、随机剔除(0.0952)和八张干净图像(0.1030)。向纯净库注入仅0.5%异常补丁,即可使AUPRC从0.1030降至0.0759。在所有五组预留测试对上,新方法均优于朴素扩展,平均提升0.0142 AUPRC。结果表明,参考数据纯净度是关键设计变量,未经验证图像仅在显式过滤后才具价值。
原文摘要 · Abstract (English)
Patch-memory anomaly detectors assume that their reference bank is normal, an assumption that is difficult to guarantee when additional industrial images are unverified. We study whether a few trusted normal images can safely recover useful normal patches from such references without defect masks. Starting from the DINOv2 patch-memory formulation used by AnomalyDINO, we score candidate patches by distance to a clean seed bank, discard the most suspicious 20%, merge the retained patches with the seed, and enforce a fixed budget by greedy coreset selection. On Severstal, naive additional references contain 9.46% anomalous patches; the proposed trim rejects 78.1\% of them and reduces residual contamination to 2.59%. At an equal 51,200-patch development budget, the proposed bank reaches 0.1084 AUPRC versus 0.0950 for naive expansion, 0.0952 for random removal, and 0.1030 for eight clean images. Injecting only 0.5\% anomalous patches into a clean bank reduces AUPRC from 0.1030 to 0.0759. On all five completed held-out pairs, the proposed bank improves over naive expansion, with a mean gain of 0.0142 AUPRC. Reference purity is therefore a first-order design variable, and unverified images are useful only when their contribution is filtered explicitly.
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