用缺陷标注图指导模型关注故障区域，提升定位精度。

Ground-truth defect masks in industrial inspection datasets are typically reserved for evaluation. This paper repurposes them as spatial supervision signals during training of classification networks, teaching a model not just what to predict but where to look. The method adds an activation-based attention alignment loss that steers convolutional feature maps toward defect regions, in a mixed-supervision formulation that also accommodates samples without masks, such as diffusion-generated images. Combined with DDPM augmentation, synthetic images contribute quantity while masks contribute spatial precision. We evaluate 85 models (four CNN backbones under a 2x2 data/training factorial over five seeds, plus a Swin-V2-T transformer baseline) on the MVTec-AD bottle benchmark, with localization measured on held-out defect images excluded from classifier gradient updates. Main findings: (1) attention-guided training improves activation-based localization (Pixel-AUROC) by +18.0% for EfficientNetB0 with augmentation (p=0.005, Cohen's d=2.6) and +18.7% for ResNet50 (p=0.008), significant in four of eight CNN settings (uncorrected for multiple comparisons) with no significant change in classification; (2) for EfficientNetB0 a data x training-mode interaction is significant (p=0.002), consistent with a super-additive effect (+13.6% combined vs +1.6% summed individual effects); (3) architectures with weaker spatial representations benefit most, whereas ConvNeXt-T shows no effect, apparently because its depthwise-convolution activations yield spatially uninformative channel-mean maps; (4) unsupervised PatchCore remains the strongest localizer (Pixel-AUROC=0.983), contextualizing the supervised gains. These results show that existing evaluation masks can act as practical training signals that measurably and reproducibly improve where defect classifiers attend.